45drivesxl60, "Flexible IO Tester 3.25 - Type: Random Read - Engine: POSIX AIO - Buffered: No - Direct: Yes - Block Size: 4KB - Disk Target: Default Test Directory", Higher Results Are Better "10 Per VDEV RaidZ2",679,689,687 "5 Per VDEV RaidZ2",687,695,695 "Mirrors",695,703,694 "DELL ENT NVME SSD1",27.4,27.2,27.3 "DELL SAMSUNG SSD4",38.4,38.4,38.4 "DELL ENTERPRISE NVME",47.2,47.2,47.2 "SAMSUNG ZFS MIRROR",385,389,389 "Flexible IO Tester 3.25 - Type: Random Read - Engine: POSIX AIO - Buffered: No - Direct: Yes - Block Size: 4KB - Disk Target: Default Test Directory", Higher Results Are Better "10 Per VDEV RaidZ2",174000,176000,176000 "5 Per VDEV RaidZ2",176000,178000,178000 "Mirrors",178000,180000,178000 "Mirrors",177000,179000,179000 "DELL ENT NVME SSD1",7019,6971,6984 "DELL SAMSUNG SSD4",9833,9817,9826 "DELL ENTERPRISE NVME", "SAMSUNG ZFS MIRROR",98400,99500,99500 "Flexible IO Tester 3.25 - Type: Random Write - Engine: POSIX AIO - Buffered: No - Direct: Yes - Block Size: 4KB - Disk Target: Default Test Directory", Higher Results Are Better "10 Per VDEV RaidZ2",363,357,361 "5 Per VDEV RaidZ2",431,436,428 "Mirrors",516,497,503 "DELL ENT NVME SSD1",73.3,68.7,73.3,61.8,68.7,73.5,72.9,72.9,73.8,68.7,68.9,73.2,73.1,73.3,73.4 "DELL SAMSUNG SSD4",24.4,24.4,24.4 "DELL ENTERPRISE NVME",239,240,240 "SAMSUNG ZFS MIRROR",702,702,704 "Flexible IO Tester 3.25 - Type: Random Write - Engine: POSIX AIO - Buffered: No - Direct: Yes - Block Size: 4KB - Disk Target: Default Test Directory", Higher Results Are Better "10 Per VDEV RaidZ2",92900,91500,92500 "5 Per VDEV RaidZ2",110000,112000,109000 "Mirrors",132000,127000,129000 "DELL ENT NVME SSD1",18800,17600,18800,15800,17600,18800,18700,18700,18900,17600,17600,18700,18700,18800,18800 "DELL SAMSUNG SSD4",6241,6246,6240 "DELL ENTERPRISE NVME",61100,61300,61300 "SAMSUNG ZFS MIRROR", "Flexible IO Tester 3.25 - Type: Random Read - Engine: POSIX AIO - Buffered: No - Direct: Yes - Block Size: 128KB - Disk Target: Default Test Directory", Higher Results Are Better "10 Per VDEV RaidZ2",157000,157000,156000 "5 Per VDEV RaidZ2",158000,156000,157000 "Mirrors",156000,157000,156000 "DELL ENT NVME SSD1",1556,1566,1561 "DELL SAMSUNG SSD4",6384,6241,6356 "DELL ENTERPRISE NVME",7627,7640,7632 "SAMSUNG ZFS MIRROR",57900,59900,58400 "Flexible IO Tester 3.25 - Type: Random Write - Engine: POSIX AIO - Buffered: No - Direct: Yes - Block Size: 128KB - Disk Target: Default Test Directory", Higher Results Are Better "10 Per VDEV RaidZ2",9008,9297,8944 "DELL ENT NVME SSD1",200,205,203 "DELL SAMSUNG SSD4", "DELL ENTERPRISE NVME",2284,2289,2285 "SAMSUNG ZFS MIRROR",6232,6181,6218 "Flexible IO Tester 3.25 - Type: Random Write - Engine: POSIX AIO - Buffered: No - Direct: Yes - Block Size: 128KB - Disk Target: Default Test Directory", Higher Results Are Better "10 Per VDEV RaidZ2",72100,74400,71600 "5 Per VDEV RaidZ2",94700,92100,93700 "Mirrors",96300,96200,94700 "DELL ENT NVME SSD1",1598,1634,1618 "DELL SAMSUNG SSD4", "DELL ENTERPRISE NVME", "SAMSUNG ZFS MIRROR",49800,49400,49700 "Flexible IO Tester 3.25 - Type: Sequential Read - Engine: POSIX AIO - Buffered: No - Direct: Yes - Block Size: 4KB - Disk Target: Default Test Directory", Higher Results Are Better "10 Per VDEV RaidZ2",732,738,734 "5 Per VDEV RaidZ2",738,734,732 "Mirrors",742,737,737 "DELL ENT NVME SSD1",28.2,28,28.1 "DELL SAMSUNG SSD4",247,246,246 "DELL ENTERPRISE NVME",87,88,87.9 "SAMSUNG ZFS MIRROR",2081,1824,1680,1804,1565,1678,1771,1735,1996,1571,1514,1618,1535,1626,1795 "Flexible IO Tester 3.25 - Type: Sequential Read - Engine: POSIX AIO - Buffered: No - Direct: Yes - Block Size: 4KB - Disk Target: Default Test Directory", Higher Results Are Better "10 Per VDEV RaidZ2",187000,189000,188000 "5 Per VDEV RaidZ2",189000,188000,187000 "Mirrors",190000,189000,189000 "DELL ENT NVME SSD1",7205,7165,7179 "DELL SAMSUNG SSD4",63100,63000,63100 "DELL ENTERPRISE NVME", "SAMSUNG ZFS MIRROR",533000,467000,430000,462000,401000,430000,453000,444000,511000,402000,387000,414000,393000,416000,459000 "Flexible IO Tester 3.25 - Type: Sequential Write - Engine: POSIX AIO - Buffered: No - Direct: Yes - Block Size: 4KB - Disk Target: Default Test Directory", Higher Results Are Better "10 Per VDEV RaidZ2", "5 Per VDEV RaidZ2", "Mirrors",539,538,535 "DELL ENT NVME SSD1",74.2,63.3,69.8,74,69.8,69.8,74.3,69.8,70.2,69.9,69.8,70.4,69.6,69.8 "DELL SAMSUNG SSD4",24.9,24,24 "DELL ENTERPRISE NVME", "SAMSUNG ZFS MIRROR",1295,1268,1341,1265,1461,1430,1452,1431,1400,1441,1437,1368 "Flexible IO Tester 3.25 - Type: Sequential Write - Engine: POSIX AIO - Buffered: No - Direct: Yes - Block Size: 4KB - Disk Target: Default Test Directory", Higher Results Are Better "10 Per VDEV RaidZ2", "5 Per VDEV RaidZ2",135000,136000,136000 "Mirrors",138000,138000,137000 "DELL ENT NVME SSD1",18000,16200,17900,18900,17900,17900,19000,17900,17000,17900,17900,18000,17800,17900 "DELL SAMSUNG SSD4",6383,6387,6384 "DELL ENTERPRISE NVME",61600,61500,61400 "SAMSUNG ZFS MIRROR",331000,325000,343000,324000,374000,366000,372000,366000,359000,369000,368000,350000 "Flexible IO Tester 3.25 - Type: Sequential Read - Engine: POSIX AIO - Buffered: No - Direct: Yes - Block Size: 128KB - Disk Target: Default Test Directory", Higher Results Are Better "10 Per VDEV RaidZ2",135000,153000,146000,133000,134000,134000,138000,155000,154000,155000,153000,153000,153000,154000,154000 "5 Per VDEV RaidZ2",132000,131000,131000 "Mirrors",127000,134000,134000,134000,134000 "DELL ENT NVME SSD1",1559,1545,1554 "DELL SAMSUNG SSD4",17100,17200,17100 "DELL ENTERPRISE NVME",9461,9461,9448 "SAMSUNG ZFS MIRROR",53200,55600,54500 "Flexible IO Tester 3.25 - Type: Sequential Write - Engine: POSIX AIO - Buffered: No - Direct: Yes - Block Size: 128KB - Disk Target: Default Test Directory", Higher Results Are Better "10 Per VDEV RaidZ2",8929,9324,9141 "DELL ENT NVME SSD1",202,204,204 "DELL SAMSUNG SSD4",2078,2082,2081 "DELL ENTERPRISE NVME",2284,2286,2286 "SAMSUNG ZFS MIRROR",6288,6294,6010,5943,6102,5919,6148,6264,6316,6164 "Flexible IO Tester 3.25 - Type: Sequential Write - Engine: POSIX AIO - Buffered: No - Direct: Yes - Block Size: 128KB - Disk Target: Default Test Directory", Higher Results Are Better "10 Per VDEV RaidZ2",71400,74600,73100 "5 Per VDEV RaidZ2",92700,90400,90800 "Mirrors",99300,102000,98400 "DELL ENT NVME SSD1",1613,1627,1628 "DELL SAMSUNG SSD4",16600,16700,16600 "DELL ENTERPRISE NVME", "SAMSUNG ZFS MIRROR",50300,50300,48100,47500,48800,47300,49200,50100,50500,49300 "Flexible IO Tester 3.25 - Type: Random Read - Engine: POSIX AIO - Buffered: No - Direct: Yes - Block Size: 128KB - Disk Target: Default Test Directory", Higher Results Are Better "DELL ENT NVME SSD1",195,196,196 "DELL SAMSUNG SSD4",798,781,795 "DELL ENTERPRISE NVME",954,955,955 "SAMSUNG ZFS MIRROR",7234,7484,7301 "Flexible IO Tester 3.25 - Type: Sequential Read - Engine: POSIX AIO - Buffered: No - Direct: Yes - Block Size: 128KB - Disk Target: Default Test Directory", Higher Results Are Better "DELL ENT NVME SSD1", "DELL SAMSUNG SSD4",2133,2146,2134 "DELL ENTERPRISE NVME",1183,1183,1181 "SAMSUNG ZFS MIRROR",6646,6952,6815